Negative ion production by surface ionization at aluminum-nitride surfaces

S. Jans, P. Wurz, R. Schletti, Theo Fröhlich, E. Hertzberg, S. A. Fuselier

Journal of Applied Physics · 2000 · 16 citations · 13 references

Concepts

Abstract

In this article, we report on the observation of the formation of negatively charged ions upon reflection from an aluminum-nitride surface. Positive H2 and O2 ions are scattered at small angles of incidence off a single-crystal surface. Charge exchange at the surface yields neutral particles and negative ions in the reflected particle flux. The negative ion fractions are about 15% and 1% for oxygen and hydrogen, respectively. The particle reflection probability is only 2%, which is attributed to the roughness of the surface.

References

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