IBIC and IBIL microscopy applied to advanced semiconductor materials

C. Manfredotti, F. Fizzotti, P. Polesello, E. Vittone, Marco Truccato, Alessandro Lo Giudice, M. Jakšić, Paolo Rossi

Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms · 1998 · 24 citations · 4 references

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