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Modelling of surface roughness in variable-angle spectroscopic ellipsometry, using numerical processing of atomic force microscopy images

Surface CharacterizationEngineeringPhysicsMicroscopySurface RoughnessSpectroscopySurface ScienceApplied PhysicsNatural SciencesScanning Force MicroscopyNumerical ProcessingVariable-angle Spectroscopic EllipsometryScanning Probe MicroscopySoft MatterNanotribology