Ellipsometric assessment of (Ga, Al) As/GaAs epitaxial layers during their growth in an organometallic VPE system - Concepedia

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Ellipsometric assessment of (Ga, Al) As/GaAs epitaxial layers during their growth in an organometallic VPE system

36

Citations

3

References

1979

Year

J. B. Theeten, F. Hottier, J. Hallais

Journal of Crystal Growth

Materials EngineeringIi-vi SemiconductorAs/gaas Epitaxial LayersEngineeringPhysicsOrganometallic Vpe SystemApplied PhysicsGallium OxideEllipsometric AssessmentMolecular Beam EpitaxyEpitaxial GrowthOptoelectronicsCompound Semiconductor

References

	Year	Citations

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