Scripta Materialia · 2009 · 98 citations · 30 references
Natural SciencesMaterials EngineeringMaterials ScienceMaterials CharacterizationSurface ScienceThin FilmsAtomic Force MicroscopyMetalsSurface PhysicsThin-film MaterialsFilm Growth MechanismsNitrides Thin FilmsThin Film Surface Characterization
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In situ site-specific specimen preparation for atom probe tomography
Keith Thompson, D. Lawrence, DJ Larson et al. · Ultramicroscopy · 2006 · 1.7K citations
Thomas F. Kelly, Michael K. Miller · Review of Scientific Instruments · 2007 · 857 citations · Full text
Natural Sciences, Materials Engineering, Materials Science +10
Atom probe field ion microscopy
M.K. Miller · Vacuum · 1994 · 812 citations