Publication | Open Access
High quality factor two dimensional GaN photonic crystal cavity membranes grown on silicon substrate
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Citations
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References
2012
Year
EngineeringOptoelectronic DevicesChemistryLuminescence PropertyE-beam LithographyCompound SemiconductorNanophotonicsPhotonicsPhotoluminescencePhotonic MaterialsOptoelectronic MaterialsAluminum Gallium NitrideSilicon SubstratePhotonic DeviceApplied PhysicsQuality FactorGan Power DeviceHard MaskOptoelectronics
We report on the achievement of freestanding GaN photonic crystal L7 nanocavities with embedded InGaN/GaN quantum wells grown by metal organic vapor phase epitaxy on Si (111). GaN was patterned by e-beam lithography, using a SiO2 layer as a hard mask, and usual dry etching techniques. The membrane was released by underetching the Si (111) substrate. Micro-photoluminescence measurements performed at low temperature exhibit a quality factor as high as 5200 at ∼420 nm, a value suitable to expand cavity quantum electrodynamics to the near UV and the visible range and to develop nanophotonic platforms for biofluorescence spectroscopy.
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