Publication | Closed Access
Effect of process conditions on uniformity of velocity and wear distance of pad and wafer during chemical mechanical planarization
61
Citations
6
References
2004
Year
Materials ScienceEngineeringWear TestingMicrofabricationTool WearMechanical EngineeringWear ModellingProcess ConditionsWear DistanceElectronic PackagingWear-resistant MaterialChemical Mechanical PlanarizationMechanics Of Materials
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