Publication | Closed Access
Growth Condition Dependence of Carbon Reduction in GaAs Chemical Beam Epitaxy Using Trisdimethylamino-Arsine and Trimethylgallium
11
Citations
6
References
1994
Year
Materials ScienceElectrical EngineeringGrowth Condition DependenceEngineeringCrystalline DefectsCarbon ReductionApplied PhysicsCarbon IncorporationCracking TemperatureCracker CellSemiconductor MaterialMolecular Beam EpitaxyEpitaxial GrowthOptoelectronicsCompound Semiconductor
It was found that carbon incorporation in GaAs chemical beam epitaxy (CBE) using trisdimethylamino-arsine (TDMAAs) and trimethylgallium (TMGa) strongly depends on the V/III ratio and the cracking temperature of TDMAAs. Although a high concentration of carbon was incorporated for the growth with low V/III ratio, the carbon concentration was reduced to the order of 10 16 cm -3 at high V/III ratios. For the layer grown using TDMAAs precracked at 550° C by a cracker cell, the carbon concentration was above 10 19 cm -3 . These results suggest that arsenic-dimethylamine (DMA) bonds rather than DMA itself play an important role in the carbon gettering mechanism.
| Year | Citations | |
|---|---|---|
Page 1
Page 1