Japanese Journal of Applied Physics · 1990 · 14 citations · 10 references
Natural SciencesMaterials EngineeringMaterials ScienceCrystal StructureElectronic MaterialsInorganic ChemistryCrystal GrowthCrystallographyEpitaxial GrowthSemiconductor Crystal GrowthX-ray CrystallographyX-ray DiffractionAtmospheric PressureAtomic Layer EpitaxyEpitaxial Film GrowthEpitaxial Growth KineticsLattice ParametersSelf-limiting GrowthSubstrate Temperature EffectsZinc Sulfides
Atmospheric pressure ALE (atomic layer epitaxy) has been achieved to grow ZnSe for the first time using Zn and H 2 Se. It is confirmed that the growth rate is controlled by the self-limiting process itself. The ALE growth of ZnSe is observed in the substrate temperature range of 350–500°C and in the input partial pressure ranges of 5×10 -6 –1×10 -4 atm for Zn and 4×10 -5 –2×10 -3 atm for H 2 Se. Lattice parameters perpendicular to the surface plane and the values of FWHM for the diffraction pattern were obtained by the X-ray double-crystal diffraction measurement.
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Coherent Growth of ZnSe on GaAs by MOCVD
Hiroshi Mitsuhashi, Iwao Mitsuishi, M. Mizuta et al. · Japanese Journal of Applied Physics · 1985 · 169 citations