EBIC analysis of CuInSe2 devices

Charge collection scanning electron microscopy

H. J. Leamy · Journal of Applied Physics · 1982 · 776 citations

Engineering, Electrical Engineering, Materials Science +17

Quantification of the effects of generation volume, surface recombination velocity, and diffusion length on the electron-beam-induced current and its derivative: Determination of diffusion lengths in the low micron and submicron ranges

Keung L. Luke, Oldwig von Roos, Li‐Jen Cheng · Journal of Applied Physics · 1985 · 65 citations

Engineering, Electrical Engineering, Materials Science +15

EBIC investigations of junction activity and the role of oxygen in CdS/CuInSe2 devices

R. Matson, R. Noufi, R. K. Ahrenkiel et al. · Solar Cells · 1986 · 50 citations

Engineering, Materials Engineering, Materials Science +16

CdS induced homojunction formation in crystalline <i>p</i>-CuInSe2

R. Matson, R. Noufi, K. J. Bachmann et al. · Applied Physics Letters · 1987 · 27 citations

Engineering, Materials Engineering, Materials Science +17

Measurement of diffusion length in CuInSe2 and CdS by the electron beam induced current method

J. Piekoşzewski, Luís Castañer, J. J. Loferski et al. · Journal of Applied Physics · 1980 · 25 citations

Engineering, Materials Engineering, Materials Science +17