XPS measurement of lubricant layer thickness on magnetic recording disks

Quantitative electron spectroscopy of surfaces: A standard data base for electron inelastic mean free paths in solids

M. P. Seah, W. A. Dench · Surface and Interface Analysis · 1979 · 5.3K citations

Natural Sciences, Materials Science, Physics +17

Electron mean escape depths from x−ray photoelectron spectra of thermally oxidized silicon dioxide films on silicon

R. Flitsch, S. I. Raider · Journal of Vacuum Science and Technology · 1975 · 258 citations

Natural Sciences, Chemistry, Materials Science +17

Application of ESCA to polymer chemistry. XVI. Electron mean free paths as a function of kinetic energy in polymeric films determined by means of ESCA

David Clark, H. R. Thomas · Journal of Polymer Science Polymer Chemistry Edition · 1977 · 172 citations

Natural Sciences, Chemistry, Materials Science +14

Quantitative surface analysis of materials

T.S. Eyre · Tribology International · 1979 · 147 citations

Natural Sciences, Materials Engineering, Materials Science +12

ESCA determination of fluorocarbon lubricant film thickness on magnetic disk media

Robert E. Linder, P. Mee · IEEE Transactions on Magnetics · 1982 · 49 citations

Engineering, Materials Engineering, Materials Science +16