Journal of Synchrotron Radiation · 2003 · 23 citations · 0 references
Natural SciencesChemistryMaterials ScienceCrystal StructureMaterials CharacterizationSurface ScienceAtomic Force MicroscopyCrystal GrowthCrystallization ProcessesCrystallographySurface CrystallographyX-ray DiffractionCrystal MorphologyCrystal Quality ControlCrystal Surface MorphologyImpurity DefectsImpurity Effects On CrystallizationImpurity IncorporationStep GrowthX-ray Diffraction Analysis
Atomic force microscopy (AFM) and X-ray diffraction experiments have been combined to study the correlation between impurity incorporation, crystal surface morphology and crystal quality. Hen egg-white lysozyme has been used as a model protein, and covalently bound lysozyme dimer as a model impurity. AFM observation of the [101] crystal face revealed that the crystal surface clearly became rough when 5% impurity was added, and the steps disappeared as the impurity concentration increased to 10%. The crystal quality was evaluated by four factors: maximum resolution limit, <I>/<sigmaI>, Rmerge, and overall B factor. In every index, the crystal quality tended to degrade as the impurity concentration increased. The B-factor dropped significantly at 5% impurity; at the same time the step roughening was observed. This strongly suggested that the impurity incorporation affected the step growth mechanism and degraded the crystal quality.