China Economic Review · 2015 · 593 citations · 34 references
ManagementInnovation ManagementIntellectual Property LawInnovationIntellectual PropertyPatent LawIntellectual Property ProtectionPatent AnalysisPatent ExaminationPatent StrategyPatent IndicatorsPatent Quality ControlPatent Quality MetricsSubsidy ImpactsSubsidy OversightSubsidy Policy
34
Sample Selection Bias as a Specification Error
James J. Heckman · Econometrica · 1979 · 28.9K citations
Citation Frequency and the Value of Patented Inventions
Dietmar Harhoff, Francis Narin, F. M. Scherer et al. · The Review of Economics and Statistics · 1999 · 1.5K citations