Patent Quality Control

Patent Quality Control is a systematic methodology within patent prosecution strategy that ensures the accuracy, legal defensibility, and technical coherence of patent documents by applying predefined review standards, error-detection protocols, and compliance checks throughout the drafting and filing process.

95

Publications

6.7K

Citations

164

Authors

123

Institutions

Publications per year

2017–2026

26

Authors

164

  1. AB
    Adam B. Jaffe

    Brandeis University, United States

    8 publications · 507 citations

    8

    h-index

  2. GD
    Gaétan de Rassenfosse

    École Polytechnique Fédérale de Lausanne, Switzerland

    8 publications · 507 citations

    8

    h-index

  3. BV
    Bruno van Pottelsberghe de la Potterie

    Université Libre de Bruxelles, Belgium

    4 publications · 256 citations

    4

    h-index

  4. DH
    Dietmar Harhoff

    Ludwig-Maximilians-Universität München, Germany

    4 publications · 488 citations

    4

    h-index

  5. DC
    David C. Mowery

    University of California, Berkeley, United States

    4 publications · 884 citations

    4

    h-index

1–5 of 164

Venues

  1. SSRN Electronic Journal

    Repository · 15 publications · 655 citations

    13

    h-index

  2. World Patent Information

    9 publications · 162 citations

    9

    h-index

  3. Research Policy

    8 publications · 1.5K citations

    8

    h-index

  4. Berkeley technology law journal

    6 publications · 189 citations

    6

    h-index

  5. China Economic Review

    5 publications · 863 citations

    5

    h-index

1–5