Patent Analysis

Patent Analysis is a systematic research method within technology forecasting that examines patent documents to identify innovation trends, technological trajectories, and competitive intelligence by leveraging the structured disclosure of inventions in intellectual property databases.

5.2K

Publications

391.5K

Citations

8.3K

Authors

2.5K

Institutions

Publications per year

2017–2026

1.7K

Authors

8.3K

  1. BH
    Bronwyn H. Hall

    University of California, Berkeley, United States

    38 publications · 11.3K citations

    30

    h-index

  2. JY
    Janghyeok Yoon

    Konkuk University, South Korea

    39 publications · 2.5K citations

    29

    h-index

  3. DH
    Dietmar Harhoff

    Ludwig-Maximilians-Universität München, Germany

    37 publications · 6.5K citations

    28

    h-index

  4. AB
    Adam B. Jaffe

    Brandeis University, United States

    38 publications · 25.4K citations

    28

    h-index

  5. BV
    Bruno van Pottelsberghe de la Potterie

    Université Libre de Bruxelles, Belgium

    32 publications · 2.8K citations

    26

    h-index

1–5 of 8.3K

Venues

  1. Research Policy

    216 publications · 41.6K citations

    102

    h-index

  2. SSRN Electronic Journal

    Repository · 405 publications · 17.7K citations

    68

    h-index

  3. Technological Forecasting and Social Change

    149 publications · 14K citations

    64

    h-index

  4. Scientometrics

    272 publications · 14.4K citations

    63

    h-index

  5. World Patent Information

    239 publications · 8.9K citations

    42

    h-index

1–5