Physical review. B, Condensed matter · 1990 · 21 citations · 40 references
Natural SciencesMaterials SciencePhysicsCondensed Matter PhysicsElectronic MaterialsSemiconductor MaterialsMetal-semiconductor ContactsSemiconductor Device MaterialsSemiconductor PhysicsSemiconductor SurfacesSurface PhysicsX-ray Photoelectron SpectroscopyAngle-resolved Photoemission SpectroscopyAngle-resolved X-ray Photoelectron SpectroscopyBand BendingSchottky Barrier ContactsSchottky BarriersSilicon Surface ScienceSoft X-ray SpectroscopySurface Band Bending
We present angle-resolved ultraviolet and soft-x-ray photoelectron spectroscopy results for the Schottky-barrier formation of Ga on p-type Si(113). For the first 0.08 monolayer of Ga, the band bending increases. For higher coverages, it decreases monotonically until it reaches its final value at about 2 monolayers. This change of band bending is found for a Si surface for the first time and supports a recent model calculation. The final barrier height is 0.32\ifmmode\pm\else\textpm\fi{}0.10 eV, in good agreement with the values found for low-index surfaces.
40
Schottky Barrier Heights and the Continuum of Gap States
J. Tersoff · Physical Review Letters · 1984 · 1.4K citations
Volker Heine · Physical Review · 1965 · 1.3K citations
Natural Sciences, Chemistry, Physics +12
Surface reactions of silicon with aluminum and with indium
J. J. Lander, John H. Morrison · Surface Science · 1964 · 299 citations