Publication | Closed Access
Impact ionization in Al<i>x</i>Ga1−<i>x</i>As for <i>x</i>=0.1–0.4
64
Citations
10
References
1988
Year
Aluminium NitrideElectrical EngineeringIon ImplantationEngineeringImpact Ionization CoefficientsPhysicsApplied PhysicsAtomic PhysicsImpact IonizationIon Beam InstrumentationIon BeamHole Ionization CoefficientAccurate Device DesignMicroelectronicsIon EmissionIon Process
The impact ionization coefficients in AlxGa1−xAs have been experimentally determined for compositions x≤0.4. These data are necessary for accurate device design and modeling. Both α, the electron ionization coefficient, and β, the hole ionization coefficient, decrease with increasing x, and there is no appreciable change in the ratio α/β over the range of compositions and electric fields studied.
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