Concepedia

Publication | Closed Access

Comparison of the charge collecting properties of junctions and the SEU response of microelectronic circuits

DOI

23

Citations

9

References

1991

Year

P.J. McNulty, David R. Roth, W.J. Beauvais, W.G. Abdel-Kader, Dennis Dinge
International Journal of Radiation Applications and Instrumentation Part D Nuclear Tracks and Radiation Measurements

References

YearCitations

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