W.G. Abdel-Kader

Implications of angle of incidence in SEU testing of modern circuits

Robert A. Reed, P.J. McNulty, W.G. Abdel-Kader · IEEE Transactions on Nuclear Science · 1994 · 45 citations

Engineering, Electrical Engineering, Physics +11

Proton induced spallation reactions

P.J. McNulty, W.G. Abdel-Kader, G. Farrell · Radiation Physics and Chemistry · 1994 · 43 citations

Natural Sciences, Physics, Nuclear Physics +6

Comparison of Soft Errors Induced by Heavy Ions and Protons

J. M. Bisgrove, J. Lynch, P.J. McNulty et al. · IEEE Transactions on Nuclear Science · 1986 · 41 citations

Natural Sciences, Nuclear Engineering, Physics +16

Modeling charge collection and single event upsets in microelectronics

P.J. McNulty, W.G. Abdel-Kader, J. Lynch · Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms · 1991 · 35 citations

Engineering, Electrical Engineering, Physics +12

Proton and heavy ion upsets in GaAs MESFET devices

T.R. Weatherfold, L. Tran, W.J. Stapor et al. · IEEE Transactions on Nuclear Science · 1991 · 30 citations

Engineering, Electrical Engineering, Microelectronics +16