2013 · 22 citations · 14 references
EngineeringElectrical EngineeringMaterials ScienceMicroelectronicsNanotechnologySemiconductor MaterialsDevice CharacterizationDevice ReliabilityMems SwitchesNanoelectromechanical SystemsNanoelectronicsSemiconductor Device MaterialsHigh PerformanceLogic DevicesLogic GatesNanoelectronic DevicesRobust PerformanceSilicon CarbideSwitching DevicesSwitching Performance
We demonstrate nanoelectromechanical contact-mode switches and logic gates with high performance, enabled by cantilever-structured SiC nanoelectromechanical systems (NEMS). In full-cycle recording measurements (complete time-domain trace of every single switching cycle recorded), we show that in ambient air, SiC NEMS switches with nanocontacts have operated >1×10 <sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">7</sup> cycles of `hot-switching' without failure (devices still alive). When only recording valid `on'/`off' states (without the complete trace, to avoid overflowing data recording and to speed up acquisition), >2×10 <sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">10</sup> cycles have been measured. These clearly exhibit the unique properties and advantages of SiC NEMS, amongst all contact-mode, genuinely nanoscale switches. We also show robust switching events at high temperature T~500°C.
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Mechanical Computing Redux: Relays for Integrated Circuit Applications
V. Pott, Hei Kam, Rhesa Nathanael et al. · Proceedings of the IEEE · 2010 · 146 citations
Engineering, Computer Engineering, Electrical Engineering +16