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Silicon carbide (SiC) nanoelectromechanical switches and logic gates with long cycles and robust performance in ambient air and at high temperature
22
Citations
14
References
2013
Year
Unknown Venue
Electrical EngineeringElectronic DevicesEngineeringNanoelectronicsNanotechnologySic NemsApplied PhysicsNano Electro Mechanical SystemSilicon CarbideIntegrated CircuitsLogic GatesPower SemiconductorsNanocomputingMicroelectronicsBeyond CmosAmbient AirCarbideSemiconductor Device
We demonstrate nanoelectromechanical contact-mode switches and logic gates with high performance, enabled by cantilever-structured SiC nanoelectromechanical systems (NEMS). In full-cycle recording measurements (complete time-domain trace of every single switching cycle recorded), we show that in ambient air, SiC NEMS switches with nanocontacts have operated >1×10 <sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">7</sup> cycles of `hot-switching' without failure (devices still alive). When only recording valid `on'/`off' states (without the complete trace, to avoid overflowing data recording and to speed up acquisition), >2×10 <sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">10</sup> cycles have been measured. These clearly exhibit the unique properties and advantages of SiC NEMS, amongst all contact-mode, genuinely nanoscale switches. We also show robust switching events at high temperature T~500°C.
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