Publication | Closed Access
Ultrafast switching in magnetic tunnel junction based orthogonal spin transfer devices
155
Citations
17
References
2010
Year
Non-volatile MemoryEngineeringMagnetic ResonanceSpintronic MaterialSpin DynamicSpin PhenomenonUltrafast MagnetismMagnetoresistanceResistive Random-access MemoryMagnetismFree LayerMemory DeviceMagnetic Tunnel JunctionElectrical EngineeringUltrafast EnergyPhysicsMagnetoresistive Random-access MemoryMicroelectronicsReliable SwitchingSpintronicsApplied PhysicsCondensed Matter PhysicsMagnetic Device
Orthogonal spin-transfer magnetic random access memory (OST-MRAM) uses a spin-polarizing layer magnetized perpendicularly to a free layer to achieve large spin-transfer torques and ultrafast energy efficient switching. We have fabricated and studied OST-MRAM devices that incorporate a perpendicularly magnetized spin-polarizing layer and a magnetic tunnel junction, which consists of an in-plane magnetized free layer and synthetic antiferromagnetic reference layer. Reliable switching is observed at room temperature with 0.7 V amplitude pulses of 500 ps duration. The switching is bipolar, occurring for positive and negative polarity pulses, consistent with a precessional reversal mechanism, and requires an energy of less than 450 fJ.
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