Thermal diffuse x-ray-scattering studies of the water-vapor interface

Abstract

Agreement between the theoretical and measured resolution dependence of x-ray specular reflection from the ${\mathrm{H}}_{2}$O-vapor interface shows that the macroscopic capillary model for surface roughness can be extended to length scales as small as 400 \AA{}. Agreement between measured thermal diffuse scattering data and the theoretical form, with no significant adjustable parameters, independently leads to similar conclusions.