Computer analysis of step-scanned X-ray data

Abstract

The advantages of the step-scan mode over a continuous scan in X-ray data collection are discussed. Computer analysis of the recorded profile allows corrections for effects such as non-uniform background, β-filter cut-off, thermal diffuse scattering, and counter dead time, as well as a reduction in the experimental standard deviations. It is concluded that the continuous scan mode should be avoided in careful crystallographic studies.