Publication | Closed Access

Electron scattering mechanisms in indium-tin-oxide thin films: grain boundary and ionized impurity scattering

Materials ScienceIndium-tin-oxide Thin FilmsEngineeringPhysicsOxide ElectronicsSurface ScienceApplied PhysicsIntrinsic ImpurityIonized ImpuritySemiconductor MaterialThin FilmsThin Film Processing