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Electroabsorption avalanche photodiodes
32
Citations
10
References
1974
Year
SemiconductorsWide-bandgap SemiconductorElectrical EngineeringOptical MaterialsUsual Absorption EdgeAbsorption MechanismPhysicsEngineeringOptical PropertiesSemiconductor TechnologyPhotoelectric SensorApplied PhysicsElectroabsorption Avalanche PhotodiodesAbsorption EdgeInstrumentationOptoelectronicsCompound SemiconductorImage Sensor
Schottky barrier avalanche photodiodes have been fabricated on n-type high-purity epitaxial GaAs. These devices have their largest response at wavelengths beyond the usual absorption edge for high-purity materials. The absorption mechanism involves the Franz-Keldysh shift of the absorption edge, and the higher response at the longer wavelengths can be explained by a much higher ionization coefficient for holes than for electrons. The results indicate that the ratio of βp to αn is even larger than previous measurements have given.
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