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Characterization of MBE grown Si/GexSi1−x strained layer superlattices

DOI

47

Citations

9

References

1987

Year

D. C. Houghton, D. J. Lockwood, M. W. C. Dharma‐wardana, E.W. Fenton, J.‐M. Baribeau, M. W. Denhoff
Journal of Crystal Growth

References

YearCitations

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