Surface Science · 1978 · 162 citations · 10 references
EngineeringGeophysicsSurface EngineeringSurface MetrologySurface RoughnessBackscatter AnalysisBackscattering
10
Monte Carlo Channeling Calculations
J. H. Barrett · Physical review. B, Solid state · 1971 · 682 citations
Stoichiometry of thin silicon oxide layers on silicon
T. W. Sigmon, W. K. Chu, E. Lugujjo et al. · Applied Physics Letters · 1974 · 109 citations
Natural Sciences, Materials Engineering, Materials Science +15
Surface relaxation of Pt(111) investigated by ion scattering
E. Bøgh, I. Stensgaard · Physics Letters A · 1978 · 42 citations