Journal of Applied Physics · 1964 · 79 citations · 10 references
EngineeringElectrical EngineeringPhysicsElectronic MaterialsHeat TransferSemiconductor DevicesDevice ReliabilitySemiconductor ReliabilityBreakdown MechanismsBreakdown VoltageElectrical BreakdownElectrical Breakdown StrengthField EmissionTemperature Dependence
Breakdown by thermal instability of a field emitter is analyzed, taking into account the temperature dependence of field emission and of resistivity. Beyond a certain temperature the emission increases while the necessary field drops. It is shown that for a whisker-like emitter this instability occurs when the emitting tip is only several hundred degrees centigrade hotter than the bulk of the cathode.
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Electrical Breakdown in High Vacuum
W. S. Boyle, P. Kisliuk, L. H. Germer · Journal of Applied Physics · 1955 · 129 citations