Use of spatial phase shifting technique in digital speckle pattern interferometry (DSPI) and digital shearography (DS)

Abstract

Digital speckle pattern interferometry (DSPI) and digital shearography (DS) are well known optical tools for qualitative as well as quantitative measurements of displacement components and its derivatives of engineering structures subjected either static or dynamic load. Spatial phase shifting (SPS) technique is useful for extracting quantitative displacement data from the system with only two frames. Optical configurations for DSPI and DS with a double aperture mask in front of the imaging lens for spatial phase shifting are proposed in this paper for the measurement of out-of-plane displacement and its first order derivative (slope) respectively. An error compensating four-phase step algorithm is used for quantitative fringe analysis.