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Precise Quantized Hall Resistance Measurements in GaAs/Al<sub>x</sub>Ga<sub>1-x</sub>As and In<sub>x</sub>Ga<sub>1-x</sub>As/InP Heterostructures
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Citations
13
References
1986
Year
SemiconductorsQuantum ScienceElectrical EngineeringSemiconductor TechnologyDifferent HeterostructuresEngineeringPhysicsWide-bandgap SemiconductorCategoryquantum ElectronicsSpecific ResistanceCondensed Matter PhysicsQuantum MaterialsApplied PhysicsCryogenic Current ComparatorResistance-ratio Measurement BridgeQuantum Engineering
Measurements of the quantized Hall resistance RH (i) (i = 2 or 4) in 7 different heterostructures (six GaAs based, one InP based) are reported. RH (i) is measured in terms of ΩLCIE by means of a resistance-ratio measurement bridge using a cryogenic current comparator.
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