Proceedings of the IEEE · 1963 · 27 citations · 0 references
EngineeringElectrical EngineeringPhysicsCircuit TheoryMicroelectronicsSemiconductor DevicesCurrent-voltage CharacteristicsDevice CharacterizationElectrical CharacterizationElectrical MeasurementField-effect TransistorsOhm's LawDirect MeasurementField-effect Transistor Transfer CharacteristicsPower-law DistributionsPower-law ModelTransfer Characteristics
In making experimental measurements of \nfield-effect transistor static drain characteristics \nin the pinch-off region, determination \nof the effective pinch-off voltage is not \npossible by direct measurement because of \nthe presence of spurious drain current at and \nbeyond pinch-off. Further, indirect measurement \nis hampered by the absence of a theoretical straight-line function from which the pinch-off voltage may be obtained as an intercept or a slope. In this communication \na power-law relation for the transfer characteristic \nis assumed, from which values of both the pinch-off voltage and the exponent may be obtained directly from a straight-line plot of experimental quantities.