Detection of cadmium oxides on a CdTe substrate by X-AES

Auger parameter in electron spectroscopy for the identification of chemical species

C. D. Wagner · Analytical Chemistry · 1975 · 129 citations

Natural Sciences, Chemistry, Analytical Chemistry +8

Sputter cleaning and dry oxidation of CdTe, HgTe, and Hg0.8Cd0.2Te surfaces

U. Solzbach, Hans Richter · Surface Science · 1980 · 114 citations

Natural Sciences, Materials Engineering, Materials Science +16

X-ray photoelectron and Auger electron spectroscopic study of the CdTe surface resulting from various surface pretreatments: Correlation of photoelectrochemical and capacitance-potential behavior with surface chemical composition

Antonio J. Ricco, Henry S. White, Mark S. Wrighton · Journal of Vacuum Science & Technology A Vacuum Surfaces and Films · 1984 · 106 citations

Natural Sciences, Chemistry, Materials Science +17

Nondestructive analysis of Hg1−<i>x</i>Cd<i>x</i>Te (<i>x</i>=0.00, 0.20, 0.29, and 1.00) by spectroscopic ellipsometry. II. Substrate, oxide, and interface properties

Hans Arwin, D. E. Aspnes · Journal of Vacuum Science & Technology A Vacuum Surfaces and Films · 1984 · 101 citations

Natural Sciences, Materials Engineering, Materials Science +17

Nondestructive analysis of Hg1−<i>x</i>Cd<i>x</i>Te (<i>x</i>=0.00, 0.20, 0.29, and 1.00) by spectroscopic ellipsometry. I. Chemical oxidation and etching

D. E. Aspnes, Hans Arwin · Journal of Vacuum Science & Technology A Vacuum Surfaces and Films · 1984 · 89 citations

Natural Sciences, Chemistry, Materials Science +17