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A comparison of techniques for nondestructive composition measurements in CdZnTe substrates

S. P. Tobin, J. Tower, P. W. Norton, D. Chandler‐Horowitz, P. M. Amirtharaj, V. C. Lopes, W. M. Duncan, A. J. Syllaios, Christopher Ard, N. C. Giles,

Journal of Electronic Materials · 1995 · 62 citations · 9 references

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9

Optoelectronic properties of Cd1−<i>x</i>Zn<i>x</i>Te films grown by molecular beam epitaxy on GaAs substrates

D. J. Olego, J. P. Faurie, S. Sivananthan et al. · Applied Physics Letters · 1985 · 176 citations

, , +17

Crystal growth of Cd<i>1</i>−<i>x</i>Zn<i>x</i>Te and its use as a superior substrate for LPE growth of Hg0.8Cd0.2Te

S. L. Bell, S. Sen · Journal of Vacuum Science & Technology A Vacuum Surfaces and Films · 1985 · 92 citations

, , +17

Crystalline and chemical quality of CdTe and Cd1-xZnxTe grown by the Bridgman method in low temperature gradients

Manfred Mühlberg, P. Rudolph, Ch. Genzel et al. · Journal of Crystal Growth · 1990 · 84 citations

, , +17

Optical techniques for composition measurement of bulk and thin-film Cd1−<i>y</i>Zn<i>y</i>Te

S. M. Johnson, S. Sen, W. H. Konkel et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 1991 · 74 citations

, , +17

Growth and characterization of Cd1−xZnxTe and Hg1−yZnyTe

James J. Kennedy, P. M. Amirtharaj, P. R. Boyd et al. · Journal of Crystal Growth · 1988 · 66 citations

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