The role of localized states in the degradation of thin gate oxides - Concepedia

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The role of localized states in the degradation of thin gate oxides

12

Citations

32

References

2003

Year

G. Bersuker, Anatoli Korkin, L. R. C. Fonseca, Andrey A. Safonov, A. A. Bagatur’yants, Howard R. Huff

Microelectronic Engineering

Thin Gate OxidesElectrical EngineeringEngineeringPhysicsStress-induced Leakage CurrentBias Temperature InstabilityOxide ElectronicsApplied PhysicsCondensed Matter PhysicsLocalized StatesSemiconductor Device

References

	Year	Citations

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