Journal of Applied Physics · 2008 · 22 citations · 13 references
EngineeringElectrical EngineeringCircuit TheoryMicroelectromechanical SystemsMicrowave EngineeringDevice ModelingMems SwitchesMicrowave Device SimulationMicrowave Integrated CircuitsMicrowave MeasurementsMicrowave Network AnalysisCapacitive Rf Mems SwitchesEquivalent Circuit ModelingMicroelectromechanical SwitchesMicrowave Circuit ModelingMicrowave ModelingParasitic EffectsParasitic Element ModelingParasitic Elements
In this paper, a circuit model to predict the microwave response of a shunt-connected capacitive microelectromechanical coplanar switch is proposed. The numerical values of the lumped elements composing the equivalent circuit are computed by means of a fully analytic approach. In particular, the contribution of resistive and inductive parasitic elements has been evaluated by using closed-form expressions. Configurations characterized by different technological solutions have been obtained and modeled. Simulations performed with the proposed approach correlate very well with actual measurements.
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