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Internal reflection mode scanning near-field optical microscopy with the tetrahedral tip on metallic samples

Materials ScienceOptical MaterialsInternal Reflection ModeEngineeringMicroscopyOptical PropertiesTetrahedral TipMicroscopy MethodApplied PhysicsScanning Force MicroscopyScanning Probe MicroscopyReflectionMicroanalysisSuper-resolutionLight MicroscopyMetallic Samples