Statistical Simulation of the IC Manufacturing Process

W. Maly, Andrzej J. Strojwas

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 1982 · 77 citations · 17 references

Concepts

Abstract

Information about the random behavior of the IC manufacturing process can be applied for IC and process design tasks. In this paper a methodology for modeling random fluctuations of IC manufacturing process is proposed. A simulator of a complete bipolar manufacturing process called FABRICS, is described. A few applications illustrating advantages of the proposed statistical process modeling method are discussed.

References

17