Stress, texture and microstructure of zirconium thin films probed by X-ray diffraction - Concepedia

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Stress, texture and microstructure of zirconium thin films probed by X-ray diffraction

24

Citations

34

References

2008

Year

J. Chakraborty, Kishor Kumar, S. Mukherjee, S. K. Ray

Thin Solid Films

Materials ScienceMaterial AnalysisEngineeringMaterial PropertySurface ScienceApplied PhysicsZirconium Thin FilmsX-ray DiffractionThin FilmsThin Film ProcessingMicrostructure

References

	Year	Citations

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