Identifying layer switching in magnetic multilayers with x-ray resonant magnetic scattering

J. W. Freeland, V. Chakarian, Y. U. Idzerda, S. Doherty, J.-G. Zhu, J.-H. Park, C.-C. Kao

Applied Physics Letters · 1997 · 24 citations · 19 references

Concepts

Abstract

The order of layer switching in a NiFe/Cu/Co spin valve is determined directly using circular polarized x-ray resonant magnetic scattering. By monitoring changes in the angular dependence of the magnetic contributions to the reflectivity near the Fe L3 and Co L3 edges as a function of applied field, the order of layer switching is directly obtained.

References

19