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Fluorescence rejection in Raman spectroscopy using a gated intensified diode array detector
31
Citations
7
References
1986
Year
EngineeringLaser ScienceSurface-enhanced Raman ScatteringLaser ApplicationsChemistryDiode ArrayOptical CharacterizationHigh-power LasersDiode ArraysLaser-based SensorOptical SpectroscopyFluorescence RejectionLaser SpectroscopyOptical SensorsNatural SciencesSpectroscopyApplied PhysicsDiode Array DetectorOptoelectronicsSpectroscopic Method
Abstract A system consisting of a mode‐locked and cavity‐dumped picosecond laser and gated (5 ns) intensified diode array detector has been used to evaluate the potential of diode arrays as detectors in fluorescence rejection measurements of Raman spectra. Successful fluorescence rejection was observed, but both the level of rejection and the signal‐to‐noise improvement observed would be substantially improved if the operating characteristics of the laser system and of the array were different. It was demonstrated that the diode array opens several times, at intervals of ca 15.5 ns, for each trigger pulse supplied.
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