Publication | Closed Access
Nanoscale molybdenum gates fabricated by low damage inductively coupled plasma SF6/C4F8 etching suitable for high performance compound semiconductor transistors
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Citations
10
References
2015
Year
Materials ScienceElectrical EngineeringEngineeringLow DamageNanoelectronicsNanotechnologyApplied PhysicsSemiconductor Device FabricationMicroelectronicsPlasma EtchingNanoscale Molybdenum GatesPlasma Sf6/c4f8Semiconductor Device
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