Radiation damage in n-type silicon diodes after electron irradiation with energies between 1.5 MeV and 15 MeV

Deep-level transient spectroscopy: A new method to characterize traps in semiconductors

D. V. Lang · Journal of Applied Physics · 1974 · 3.7K citations

Transient Grating, Engineering, Exponential Capacitance Transients +18

Crosslinking of recycled polyethylene by gamma and electron beam irradiation

E. Adem, M. Ávalos‐Borja, Diónico Carrillo et al. · Radiation Physics and Chemistry · 1998 · 1.5K citations

Materials Science, Chemical Engineering, Engineering +12

Defects in Irradiated Silicon: Electron Paramagnetic Resonance of the Divacancy

G. D. Watkins, J. W. Corbett · Physical Review · 1965 · 719 citations

Activated Reorientation, Engineering, Magnetic Resonance +17

Deep Level Transient Fourier Spectroscopy (DLTFS)—A technique for the analysis of deep level properties

Sharon M. Weiss, Rainer Kassing · Solid-State Electronics · 1988 · 358 citations

Deep Level Properties, Physics, —A Technique +8

Radiation damage in silicon detectors

Gunnar Lindström · Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment · 2003 · 255 citations

Radiation Detection, Physics, Radiation Damage +2