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$\Omega$-Gated Silicon and Strained Silicon Nanowire Array Tunneling FETs
45
Citations
14
References
2012
Year
SemiconductorsExperimental ResultsElectrical EngineeringSilicon NanowiresEngineeringSemiconductor TechnologyTunneling MicroscopyNanoelectronicsApplied PhysicsQuantum DevicesIntegrated CircuitsSilicon On InsulatorSemiconductor DeviceNegative Differential Conductance
This letter presents experimental results on tunneling field-effect transistors featuring arrays of Ω-gated uniaxially strained and unstrained silicon nanowires. The gate control of a SiO <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</sub> /poly-Si gate stack is compared with a high- <i xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">k</i> /metal gate stack. Steep inverse subthreshold slopes down to 76 mV/dec and relatively high on-currents were achieved with the combination of high- <i xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">k</i> /metal gate and strained silicon nanowires. We observed negative differential conductance in the output characteristics, which we attribute to hot-carrier effects in the strong electric fields at the reverse-biased tunnel junction.
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