Comment on Tilt of Atomic Force Microscope Cantilevers: Effect on Spring Constant and Adhesion Measurements

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ADVERTISEMENT RETURN TO ISSUEPREVCommentComment on Tilt of Atomic Force Microscope Cantilevers: Effect on Spring Constant and Adhesion MeasurementsJeffrey L. HutterView Author Information Department of Physics & Astronomy, The University of Western Ontario, London, Ontario N6A 3K7, Canada Cite this: Langmuir 2005, 21, 6, 2630–2632Publication Date (Web):February 8, 2005Publication History Received18 September 2004Revised3 December 2004Published online8 February 2005Published inissue 1 March 2005https://pubs.acs.org/doi/10.1021/la047670thttps://doi.org/10.1021/la047670tarticle-commentaryACS PublicationsCopyright © 2005 American Chemical Society. This publication is available under these Terms of Use. Request reuse permissions This publication is free to access through this site. Learn MoreArticle Views2513Altmetric-Citations100LEARN ABOUT THESE METRICSArticle Views are the COUNTER-compliant sum of full text article downloads since November 2008 (both PDF and HTML) across all institutions and individuals. These metrics are regularly updated to reflect usage leading up to the last few days.Citations are the number of other articles citing this article, calculated by Crossref and updated daily. Find more information about Crossref citation counts.The Altmetric Attention Score is a quantitative measure of the attention that a research article has received online. Clicking on the donut icon will load a page at altmetric.com with additional details about the score and the social media presence for the given article. Find more information on the Altmetric Attention Score and how the score is calculated. Share Add toView InAdd Full Text with ReferenceAdd Description ExportRISCitationCitation and abstractCitation and referencesMore Options Share onFacebookTwitterWechatLinked InRedditEmail PDF (77 KB) Get e-AlertscloseSUBJECTS:Calibration,Mathematical methods,Order,Probes Get e-Alerts