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X-ray Photoelectron Spectroscopy Study in Bi<sub>2</sub>Sr<sub>2</sub>Ca<sub>1-x</sub>Nd<sub>x</sub>Cu<sub>2</sub>O<sub>8+d</sub>
17
Citations
15
References
1991
Year
Sr 2Ii-vi SemiconductorTransition Metal ChalcogenidesX-ray SpectroscopyEngineeringPhysicsElectron SpectroscopyElectronic StatesSpectroscopyNatural SciencesApplied PhysicsCondensed Matter PhysicsSemiconductor MaterialChemistryElemental MetalBi 2
X-ray photoelectron spectroscopy (XPS) measurements were performed in Bi 2 Sr 2 Ca 1- x Nd x Cu 2 O 8+ d (0≤ x ≤1) in order to investigate the change in the electronic states through the decrease of the holes in this system. The negative chemical shifts of the Cu 2p main peaks were observed, while their satellites did not shift but decreased in areas. These behaviors indicated that the holes at both Cu and O sites decrease with increasing Nd concentration x .
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