Solid state reaction of titanium and (0001) α-SiC

General formalism for quantitative Auger analysis

C. C. Chang · Surface Science · 1975 · 203 citations

Natural Sciences, Electrical Engineering, Mathematical Physics +4

Techniques for elemental composition profiling in thin films

J. W. Coburn, E. Kay · C R C Critical Reviews in Solid State Sciences · 1973 · 90 citations

Natural Sciences, Materials Engineering, Materials Science +14

Identification of the (0001) and the (0001) Surfaces of Silicon Carbide

Joel M. Harris, H. C. Gatos, A. F. Witt · Journal of The Electrochemical Society · 1969 · 24 citations

Natural Sciences, Materials Engineering, Materials Science +12