Interface characteristics of Mo/Si and B4C/Mo/Si multilayers using non-destructive X-ray techniques - Concepedia

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Interface characteristics of Mo/Si and B4C/Mo/Si multilayers using non-destructive X-ray techniques

19

Citations

23

References

2007

Year

H. Maury, P. Jonnard, J–M André, J. Gautier, F. Bridou, Franck Delmotte, M. F. Ravet

Surface Science

Materials ScienceEngineeringApplied PhysicsSemiconductor MaterialB4c/mo/si MultilayersNon-destructive X-ray TechniquesMultilayer HeterostructuresSemiconductor Device FabricationSilicon On InsulatorInterface Characteristics

References

	Year	Citations

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