Materials Science and Engineering B · 1997 · 25 citations · 9 references
EngineeringMaterials EngineeringMaterials ScienceCeramic MaterialsElectronic MaterialsSemiconductor DevicesAtomistic SimulationDefect ModelingDevice SimulationIon ImplantationMonte Carlo Radiation TransportRadiation Damage In MaterialsChanneling EffectsImplantation-induced Defect FormationIon Implantation EffectsIon Implantation SimulationLattice DamageSilicon Carbide (Sic) MaterialsSingle-crystal Silicon
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Nonlinear stopping power of an electron gas for slow ions
P. M. Échenique, R. M. Nieminen, J. C. Ashley et al. · Physical review. A, General physics · 1986 · 374 citations