The Rietveld method in neutron and X-ray powder diffraction

Abstract

In the Rietveld method of analysing powder diffraction data, the crystal structure is refined by fitting the entire profile of the diffraction pattern to a calculated profile. There is no intermediate step of extracting structure factors. The method was applied first to diffraction patterns recorded with neutrons at a fixed wavelength. It has now been used successfully for the treatment of results from the four categories of experimental technique, with neutrons or X-rays as the primary radiation and with the scattered intensity measured at a fixed wavelength or at a fixed scattering angle. In this article we discuss the application of the Rietveld method to each of these techniques.