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Negatively charged Si vacancy in<mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" display="inline"><mml:mn>4</mml:mn><mml:mi>H</mml:mi></mml:math>SiC: A comparison between theory and experiment
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References
1997
Year
EngineeringNuclear PhysicsMagnetic ResonanceChemistrySilicon On InsulatorCharge TransportSpin StateSemiconductorsMath XmlnsSi VacancyElectron Paramagnetic ResonancePhysicsAtomic PhysicsDefect FormationQuantum ChemistrySpintronicsNatural SciencesApplied PhysicsCondensed Matter PhysicsNeutron ScatteringNuclear Magnetic Resonance SpectroscopyCarbide
We use electron paramagnetic resonance and electron nuclear double resonance to identify the negatively charged Si vacancy in neutron-irradiated $4H$ SiC. The identification is based on resolved ligand hyperfine interactions with carbon and silicon nearest and next nearest neighbors and on the determination of the spin state, which is $S=3/2.$ The magnetic resonance parameters of ${V}_{\mathrm{Si}}^{\ensuremath{-}}$ are almost identical for the polytypes $3C,$ $4H,$ and $6H.$ The experimental findings are supported by theoretical ligand hyperfine interaction data based on a total-energy calculation using the standard local-density approximation of the density-functional theory.
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